Organizer: TU Ilmenau
Vizepräsident für Forschung Prof. Stefan Sinzinger, Prof. Eberhard Manske, TU Ilmenau
Begrüßung und Einführung
Prof. Osten – Universität Stuttgart/ DE
N.N.
Prof. Arie den Boef - ASML/NL
Digital Holographic Microscopy in Overlay metrology for the semiconductor industry
Dr. Suzanne Cosijns – ASML/ NL
N.N.
Prof. Pascal Picart - Universität Le Mans/ F
In vivo investigation of anuran sound localization with achiral digital Fresnel holography
Prof. Nathalie Picqué - Max-Born-Institut/ DE
Interferometry with optical frequency combs
Prof. Christian Rembe – TU Clausthal/ DE
Optical Metrology for Industrial Inspection with Squeezed Light
Dr. Heinrich Schwenke - Hexagon AG/ DE
Absolute Multiline Technologie: Funktionsweise und Anwendungen
Dr. Theo Pflug – Carl Zeiss SMT GmbH, Laserinstitut Hochschule Mittweida/ DE
Ultrafast spallation dynamics of a thin gold film characterized by imaging pump-probe interferometry
Prof. Eberhard Manske – TU Ilmenau/ DE
Interferometer-based nanopositioning and nanomeasuring technology at the limits of Physics and technical feasibility