Organizer: TU Ilmenau
Vizepräsident für Forschung Prof. Stefan Sinzinger, Prof. Eberhard Manske, TU Ilmenau
Begrüßung und Einführung
Prof. Osten – Universität Stuttgart/ DE
Reliable Sensor Technology for Self-Driving Cars or is AI the solution?
Abstract
Dr. Suzanne Cosijns – ASML/ NL
Interferometry, shining a light on the environment
Prof. Arie den Boef - ASML/NL
Digital Holographic Microscopy in Overlay metrology for the semiconductor industry
Abstract
Prof. Juergen Czarske - TUD Dresden University of Technology/ DE
Quantitative Phase Imaging by Endomicroscopy exploiting Deep Holography towards Microelectronics and Biomedicine
Prof. Nathalie Picqué - Max-Born-Institut/ DE
Interferometry with optical frequency combs
Abstract
Prof. Christian Rembe – TU Clausthal/ DE
Optical Metrology for Industrial Inspection with Squeezed Light
Abstract
Dr. Heinrich Schwenke - Hexagon AG/ DE
Absolute Multiline technology: Functionality and applications
Dr. Theo Pflug – Carl Zeiss SMT GmbH, Laserinstitut Hochschule Mittweida/ DE
Ultrafast spallation dynamics of a thin gold film characterized by imaging pump-probe interferometry
Abstract
Prof. Eberhard Manske – TU Ilmenau/ DE
Interferometer-based nanopositioning and nanomeasuring technology at the limits of Physics and technical feasibility
Abstract