Organizer: TU Ilmenau
Vice President for Research Prof. Stefan Sinzinger,
Prof. Eberhard Manske, TU Ilmenau
Welcome Address and Introduction
Prof. Osten – Universität Stuttgart/ DE
Reliable Sensor Technology for Self-Driving Cars or is AI the solution?
Abstract
Prof. Arie den Boef - ASML/ NL
Digital Holographic Microscopy in Overlay metrology for the semiconductor industry
Dr. Suzanne Cosijns - ASML/ NL
N.N.
Prof. Pascal Picart - Le Mans University/ F
In vivo investigation of anuran sound localization with achiral digital Fresnel holography
Midday Break and Poster Session
Prof. Nathalie Picqué - Max Born Institute/ DE
Interferometry with optical frequency combs
Abstract
Prof. Christian Rembe – TU Clausthal/ DE
Optical Metrology for Industrial Inspection with Squeezed Light
Abstract
Dr. Heinrich Schwenke - Hexagon AG/ DE
Absolute Multiline Technologie: Funktionsweise und Anwendungen
Coffee Break
Dr. Theo Pflug – Carl Zeiss SMT GmbH, Laserinstitut Hochschule Mittweida/ DE
Ultrafast spallation dynamics of a thin gold film characterized by imaging pump-probe interferometry
Abstract
Prof. Eberhard Manske – TU Ilmenau/ DE
Interferometer-based nanopositioning and nanomeasuring technology at the limits of Physics and technical feasibility
Closing Remarks
Farewell Coffee